Mahlo GmbH + Co. KG

Optoscope WLI

White light interference sensor Optoscope WLI

Interference measurement of thin layers and coatings

WHITE LIGHT INTERFERENCE

White light from the upper and lower boundary surfaces of thin films is reflected differently. Interference measurement allows for the precise measuring of transparent coatings on films and mono-films. Both, the layer thickness and film thickness can be determined with a special measuring process.

PRODUCT HIGHLIGHTS

• Simple and rapid measurement method
• Measures coating thickness and film thickness
• High accuracy and durability

CUSTOMER BENEFITS

• Quick process optimization
• Material savings
• Quality assurance